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Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2017-09-25
09:25		 Tokyo Kikai-Shinko-Kaikan Bldg. (Tokyo) Development of Event-Driven Correlated Double Sampling for A/D Converters in Pixel-Parallel 3-D Integrated CMOS Image Sensors
Masahide Goto, Yuki Honda, Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, Yoshinori Iguchi (NHK), Takuya Saraya, Masaharu Kobayashi, Eiji Higurashi, Hiroshi Toshiyoshi, Toshiro Hiramoto (Univ. of Tokyo) 		We report novel event-driven noise reduction circuits with correlated double sampling (CDS) technique for pulse-frequenc... [more] IST2017-49
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