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All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 195  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
KANSAI 2024-12-22
11:45
Osaka Osaka Metropolitan University, I-site Namba A Study on the Sensitivity of 8-Shared Pixels for a Feature-Extractable CMOS Image Sensor
Daichi Anami, Yu Osuka, Yudai Morikaku (Ritsumeikan Univ.), Ryuichi Ujiie, Daisuke Morikawa, Hideki Shima (Nisshinbo Micro Devices Inc.), Shunsuke Okura (Ritsumeikan Univ.)
(To be available after the conference date) [more]
IST 2024-11-08
15:20
Tokyo Morito Mem. Hall
(Primary: On-site, Secondary: Online)
[Invited Talk] Journey of pixel optics scaling into deep sub-micron and migration to meta optics era.
In-Sung Joe (Samsung Electronics)
This paper reviews pixel optics trend of current CMOS image sensors. In order to pack more pixels into compact form fact... [more] IST2024-58
pp.29-32
IST 2024-09-25
10:25
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
[Tutorial Lecture] State-of-the-Art High Dynamic Range Technologies for CMOS Image Sensors
Ken Miyauchi (Brillnics/Tohoku Univ.)
In this paper, state-of-the-art high dynamic range technologies for CMOS image sensors, which have been reported in majo... [more] IST2024-43
pp.1-4
IST 2024-09-25
16:00
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
A Study of Linear Response DCG Scheme with 4 Transistor Pixel for a CMOS Image Sensor
Ayaka Banno (Ritsumeikan Univ.), Ken Miyauchi (Brillnics Japan), Shuhei Takemoto, Ai Otani (Ritsumeikan Univ.), Yuki Morikawa, Hideki Owada, Chia-Chi Kuo, Isao Takayanagi (Brillnics Japan), Shunsuke Okura (Ritsumeikan Univ.)
High Dynamic Range (HDR) CMOS image sensors are required for use in extremely illuminated environments, such as outdoors... [more] IST2024-51
pp.34-37
IEICE-ICD, IEICE-SDM, IST [detail] 2024-08-05
16:10
Hokkaido  
(Primary: On-site, Secondary: Online)
A CMOS Temperature Sensor with Threshold Voltage Compensation
Takuto Togashi, Yoshihiro Komatsu, Shen Xiaochi, Masayuki Ikebe (Hokkaido Univ.)
In this study, we designed a temperature sensor that operates in the subthreshold region and does not require calibratio... [more] IST2024-39
pp.6-9
IEICE-ICD, IEICE-SDM, IST [detail] 2024-08-06
11:00
Hokkaido  
(Primary: On-site, Secondary: Online)
Understanding Abnormal Vth Increase Induced by Hot Carrier Injection at Cryogenic Temperatures
Shunsuke Shitakata (Keio Univ./AIST), Hiroshi Oka, Kimihiko Kato, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Takahiro Mori (AIST)
In this study, we attempted to understand the mechanisms of hot carrier degradation in cryogenic MOSFET operation. Hot c... [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2024-08-06
11:25
Hokkaido  
(Primary: On-site, Secondary: Online)
Reducing short-circuit current of CMOS Inverter circuits with “PN-Body Tied SOI-FET”
Kazuki Nakahashi, Takayuki Mori, Jiro Ida (Kanazawa Institute of Technology)
In this study, we report the results of Short-Circuit current measurements in a CMOS inverter circuit using a "PN-Body T... [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2024-08-06
13:00
Hokkaido  
(Primary: On-site, Secondary: Online)
[Invited Talk] Terahertz Sensing with CMOS-IC -- Feasibility Verification for Short-Range Imaging using 300GHz MIMO Radar --
Ichiro Somada, Akihito Hirai, Akinori Taira, Kazuaki Ishioka, Takuma Nishimura, Koji Yamanaka (Mitsubishi Electric)
Sensing technology has gained significant interest for its potential to solve various social issues. Terahertz waves, wh... [more]
IEICE-ICD, IEICE-SDM, IST [detail] 2024-08-07
10:00
Hokkaido  
(Primary: On-site, Secondary: Online)
[Invited Talk] Curved CMOS Image Sensors Developed by SOI Transfer Technology
Masahide Goto, Shigeyuki Imura, Hiroto Sato (NHK)
We study flexible complementary metal-oxide-semiconductor (CMOS) image sensors that can be freely bent while possessing ... [more] IST2024-41
pp.14-18
IST 2024-06-19
13:15
Tokyo Tokyo University of Science Morito Memorial Hall [Poster Presentation] A High-Speed and High-Resolution Single-Slope ADC using a Stepless Acceleration Ramp and a Distributed Ramp Signal Generator with Multiple Integral Circuit
Hayato Sakoda, Toshinori Otaka, Shunichi Sato, Takayuki Hamamoto (TUS)
In compact high-resolution image sensors, both high resolution and high speed in ADCs is being demanded. So far, a metho... [more] IST2024-33
pp.5-8
ME, IST, IEICE-BioX, IEICE-SIP, IEICE-MI, IEICE-IE [detail] 2024-06-07
13:15
Niigata Nigata University (Ekinan-Campus "TOKIMATE") Lightweight Object Detection Model for a Binary Feature Extractable CMOS Image Sensor
Keiichiro Kuroda, Yudai Morikaku, Yu Osuka (Ritumeikan Univ), Ryuichi Ujiie, Daisuke Morikawa, Hideki Shima (Nisshinbo Micro Devices), Okura Syunsuke, Kota Yoshida (Ritumeikan Univ)
For the coming Society 5.0, we propose an object detection system using a CMOS image sensor capable of extracting binary... [more] IST2024-27 ME2024-52
pp.23-28
IST 2024-03-27
13:10
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
Evaluation of Object Detection Accuracy for DCG CMOS Image Sensor with 4T Pixel Structure
Shoya Nishide, Ayaka Banno (Ritsumeikan Univ.), Ken Miyauchi, Yuki Morikawa, Hideki Owada, Isao Takayanagi (Brillnics), Shunsuke Okura (Ritsumeikan Univ.)
Our research group has proposed a high dynamic range DCG CMOS image sensors based on 4T pixel for sensing applications. ... [more] IST2024-16
pp.20-24
IST 2024-03-27
14:45
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
A Study on High-Sensitivity Stacked Digital Pixel Sensor with CTIA circuit
Kazuki Tatsuta, Nao Kitajima, Yu Osuka, Shunsuke Okura (Ritsumeikan Univ.)
Small digital pixel sensor (DPS) with back-side illumination together with 3D-stacking technologies has been proposed fo... [more] IST2024-19
pp.34-38
IST 2024-03-27
15:05
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
An 0.08 e*pJ/step gain-adaptive single-slope ADC with enhanced HDR function for high-quality imagers
Luong Hung, Koji Matsuura, Hiroki Suto, Kazutoshi Kodama, Yosuke Tanaka, Toshiaki Ono, Junichiro Fujimagari, Miho Akahide, Yoshiaki Inada (Sony Semiconductor Solutions)
This paper, which was reported at IEEE Symposium on VLSI circuit 2023, presents a high-speed, power-efficient single-slo... [more] IST2024-20
pp.39-41
IST 2024-03-27
15:30
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout
Takafumi Takatsuka, Jun Ogi, Yasuji Ikeda, Kazuki Hizu, Yutaka Inaoka, Shunsuke Sakama, Iori Watanabe, Tatsuya Ishikawa, Shohei Shimada, Junki Suzuki (SSS), Hidenori Maeda, Kenji Toshima (SCK), Yusuke Nonaka, Akifumi Yamamura, Hideki Ozawa, Fumihiko Koga, Yusuke Oike (SSS)
This paper introduces the pixel front-end (PFE) circuit pitch reduction of SPAD photon count image sensor, which was rep... [more] IST2024-21
pp.42-45
IST 2023-09-15
13:20
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
A 648 x 484-Pixel 4-Tap Hybrid Time-of-Flight Image Sensor with 8 and 12 Phase Demodulation for Long-Range Indoor and Outdoor Operations
Kamel Mars, Kensuke Sakai, Yugo Nakatani, Masashi Hakamata, Keita Yasutomi, De Xing Lioe, Keiichiro Kagawa (Shizuoka Univ.), Tomoyuki Akahori, Tomohiko Kosugi, Satoshi Aoyama (Toppan Inc.), Shoji Kawahito (Shizuoka Univ.)
This paper presents a new hybrid time of flight (hToF) that combine advantages of direct time of flight (dToF) and indir... [more] IST2023-39
pp.17-20
IST 2023-09-15
14:10
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
0.56um-pitch CMOS image sensor for high resolution application
Chun Yung Ai, Kazufumi Watanabe, Sangjoo Lee, Geunsook Park (OVT US), Akira Imaizumi (OVT Japan), King W. Yeung (OVT US), Shun Cheng Tien, Pei Hsiu Tseng (OVT Taiwan), Alan Chih-Wei Hsiung, Lindsay A. Grant (OVT US)
In this paper we describe a 200Mpixel CMOS image sensor with 0.56um pixels implemented in a 28nm process. This pixel tec... [more] IST2023-41
pp.25-28
IST 2023-09-15
14:50
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
Dual conversion gain scheme for small pixel CMOS Image Sensor
Ayaka Banno, Kazuki Tatsuta, Ai Otani, Shunsuke Okura (Ritsumeikan Univ.), Ken Miyauchi, Yuki Morikawa, Sangman Han, Hideki Owada, Isao Takayanagi (Brillnics)
High Dynamic Range (HDR) CMOS image sensors are required for the use under extreme-illminated environments such as outdo... [more] IST2023-43
pp.33-36
IST 2023-09-15
16:00
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
A 3.96µm, 124dB Dynamic Range, 6.2mW Stacked Digital Pixel Sensor with Monochrome and Near-Infrared Dual-Channel Global Shutter Capture
Ken Miyauchi, Isao Takayanagi, Masato Nagamatsu, Hirofumi Abe, Kazuya Mori, Masayuki Uno, Toshiyuki Isozaki, Rimon Ikeno (Brillnics Japan), Hsin-Li Chen, Chih-Hao Lin, Wen-Chien Fu, Shou-Gwo Wuu (Brillnics), Song Chen, Lyle Bainbridge, Qing Chao, Ramakrishna Chilukuri, Wei Gao, Andrew P. Hammond, Tsung-Hsun Tsai, Chiao Liu (Meta)
This paper presents a 3.96μm, 640x640 pixel stacked digital pixel sensor capable of capturing co-located monochrome (Mon... [more] IST2023-46
pp.45-48
IST 2023-06-21
13:10
Tokyo Tokyo University of Science Morito Memorial Hall [Poster Presentation] Analysis of Light Intensity and Charge Holding Time Dependence of Full Well Capacity in CMOS Image Sensor with A Buried Overflow Transfer Gate
Ken Miyauchi (Brillnics/Tohoku Univ.), Toshiyuki Isozaki, Rimon Ikeno, Junichi Nakamura (Brillnics)
In this paper, an analytical model of CMOS image sensor full well capacity with a buried overflow transfer gate is propo... [more] IST2023-19
pp.1-4
 Results 1 - 20 of 195  /  [Next]  
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