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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-MRIS, IEICE-CPM, MMS [detail] |
2024-11-01
12:10 |
Nagano |
Shinshu Univ.
(Primary: On-site, Secondary: Online) |
[Invited Talk]
Development of oxide-based leaky-integrating transistor for spiking neural networks
Hisashi Inoue (AIST), Hiroto Tamura (Univ. Tokyo), Ai Kitoh (AIST), Xiangyu Chen, Zolboo Byambadorj (Univ. Tokyo), Takeaki Yajima (Kyushu Univ.), Yasushi Hotta (Univ. Hyogo), Tetsuya Iizuka (Univ. Tokyo), Gouhei Tanaka (Univ. Tokyo/Nagoya Inst. Tech.), Isao Inoue (AIST) |
[more] |
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| IEICE-ICD, IEICE-SDM, IST [detail] |
2024-08-05
11:25 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Performance Enhancement and Design Optimization of Analog-to-Digital Converters Utilizing Dynamic Logics
Yuhao Xu, Ritaro Takenaka, Shuowei Li, Haoming Zhang, Tetsuya Iizuka (UTokyo) |
This paper presents a study on performance optimization techniques for SAR ADC by addressing the bottlenecks in speed pe... [more] |
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| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08
16:20 |
Online |
On-line |
[Invited Talk]
A 3.3-GHz 4.6-mW Fractional-N Type-II Hybrid Switched-Capacitor Sampling PLL Using CDAC-Embedded Digital Integral Path with -80-dBc Reference Spur
Zule Xu, Masaru Osada, Tetsuya Iizuka (UTokyo) |
[more] |
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| IST, IEICE-ICD |
2011-07-22
09:25 |
Hiroshima |
Hiroshima Institute of Technology |
An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Tetsuya Iizuka, Kunihiro Asada (Univ. of Tokyo) |
This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring o... [more] |
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| IST, IEICE-ICD |
2010-07-22
10:45 |
Osaka |
Josho Gakuen Osaka Center |
Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability
Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo) |
In this paper, we propose an all-digital process variability monitor which utilizes a simple buffer ring with a pulse co... [more] |
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