ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST |
2021-10-21 10:50 |
Online |
|
High-precision CMOS Proximity Capacitance Image Sensors with Large-format 12 µm and High-resolution 2.8 µm Pixels Yuki Sugama, Yoshiaki Watanabe, Rihito Kuroda, Masahiro Yamamoto, Tetsuya Goto (Tohoku Univ.), Toshiro Yasuda, Shinichi Murakami, Hiroshi Hamori (OHT), Naoya Kuriyama (LAPIS Semiconductor), Shigetoshi Sugawa (Tohoku Univ.) |
This paper presents newly developed two high-precision CMOS proximity capacitance image sensors: Chip A with 12 µm pitch... [more] |
IST2021-51 pp.13-16 |
IST |
2021-10-21 11:10 |
Online |
|
A 1000 fps High SNR Global Shutter CMOS image Sensor for In-situ Fluid Concentration Distribution Measurements Tetsu Oikawa, Rihito Kuroda, Keigo Takahashi (Tohoku Univ.), Yoshinobu Shiba (Tohoku Univ./Fujikin), Yasuyuki Fujihara, Hiroya Shike, Maasa Murata, Chia-Chi Kuo, Yhang Ricardo Sipauba Carvalho da Silva, Tetsuya Goto, Tomoyuki Suwa, Tatsuo Morimoto, Yasuyuki Shirai (Tohoku Univ.), Masaaki Nagase, Nobukazu Ikeda (Fujikin), Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2021-52 pp.17-20 |
IEICE-SDM, IEICE-ICD, IST [detail] |
2021-08-17 09:30 |
Online |
Online |
[Invited Talk]
Development of sub-aF accuracy high resolution and realtime CMOS proximity capacitance image sensors Rihito Kuroda, Yuki Sugama, Yoshiaki Watanabe, Tetsuya Goto, Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2021-41 pp.1-4 |
IST |
2019-03-22 15:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A CMOS Proximity Capacitance Image Sensor with 0.1aF Detection Accuracy Masahiro Yamamoto, Rihito Kuroda, Manabu Suzuki, Tetsuya Goto (Tohoku Univ.), Hiroshi Hamori, Shinichi Murakami, Toshiro Yasuda, Yayoi Yokomichi (OHT Inc.), Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2019-21 pp.49-54 |
IST |
2015-05-08 15:00 |
Tokyo |
|
Effect of random telegraph noise reduction by atomically flat gate insulator film/Si interface Rihito Kuroda, Toshiki Obara, Tetsuya Goto, Naoya Akagawa, Daiki Kimoto, Akinobu Teramoto, Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2015-33 pp.35-38 |
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|