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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2021-03-26
09:25 |
Tokyo |
Online |
Evaluation of the effect of the 3D defect distribution created by plasma process on the dark current characteristics
Yoshihiro Sato, Takayoshi Yamada, Kazuko Nishimura, Masayuki Yamasaki, Masashi Murakami (Panasonic), Keiichiro Urabe, Koji Eriguchi (Kyoto Univ.) |
Plasma processing is widely used in manufacturing present-day ULSI circuits. During plasma processing, defects are creat... [more] |
IST2021-9
pp.5-8 |
| IST |
2017-03-10
16:05 |
Tokyo |
NHK Research Lab. Auditorium (Setagaya) |
Organic-Film Stacked RGB-IR Image Sensor with Electrically Controllable NIR Sensitivity
Shin'ichi Machida, Sanshiro Shishido, Takeyoshi Tokuhara, Masaaki Yanagida, Takayoshi Yamada, Masumi Izuchi, Yoshiaki Sato, Yasuo Miyake, Manabu Nakata, Masashi Murakami, Mitsuru Harada, Yasunori Inoue (Panasonic) |
We developed a visible-NIR organic CMOS image sensor with electrically controllable NIR sensitivity. The sensitivity of ... [more] |
IST2017-19
pp.43-46 |
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