ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
|
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
|
| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2020-08-07
09:30 |
Online |
Online |
[Invited Talk]
Understanding the Origin of Low-frequency Noise in Cryo-CMOS Toward Long-coherence-time Si Spin Qubit
Hiroshi Oka, Takashi Matsukawa, Kimihiko Kato, Shota Iizuka, Wataru Mizubayashi, Kazuhiko Endo, Tetsuji Yasuda, Takahiro Mori (AIST) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2017-07-31
12:00 |
Hokkaido |
Hokkaido-Univ. Multimedia Education Bldg. |
TCAD Simulation of C-TFET Circuit with Drain Offset Structure
Hidehiro Asai, Takahiro Mori, Junich Hattori, Takashi Matsukawa, Koichi Fukuda (AIST) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-03
09:00 |
Osaka |
Central Electric Club |
[Invited Talk]
SRAM PUF using Polycrystalline Silicon Channel FinFET and Its Evaluation
Shin-ichi O'uchi, Yungxun Liu, Yohei Hori, Toshifumi Irisawa, Hiroshi Fuketa, Yukinori Morita, Shinji Migita, Takahiro Mori, Tadashi Nakagawa, Junichi Tsukada, Hanpei Koike, Meishoku Masahara, Takashi Matsukawa (AIST) |
[more] |
|
| IST, IEICE-ICD |
2013-07-05
16:55 |
Hokkaido |
Sun ref re Hakodate |
A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET
Hideo Sakai (Keio Univ.), Shin-ichi O'uchi, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Yuki Ishikawa, Junichi Tsukada, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.) |
[more] |
|
|
|
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|