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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-03
13:45 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
Study and Development of Load-Adaptive Active Gate Driver Integrated Circuit for Power Device
Shusuke Kawai, Takeshi Ueno, Koutaro Miyazaki, Satoshi Takaya (Toshiba), Kohei Onizuka (Toshiba Europe Limited), Hiroaki Ishihara (Toshiba) |
[more] |
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| IEICE-MRIS, MMS |
2018-07-06
16:35 |
Tokyo |
Waseda Univ. |
Ultra-high-efficient Writing in Voltage-Control Spintronics Memory(VoCSM)
Altansargai Buyandalai, Mariko Shimizu, Hiroaki Yoda, Tomoaki Inokuchi, Yuichi Ohsawa, Naoharu Shimomura, Satoshi Shirotori, Hideyurki Sugiyama, Yushi Kato, Mizue Ishikawa, Katsuhiko Koi, Soichi Oikawa, Kazutaka Ikegami, Satoshi Takaya, Shinobu Fujita, Atsushi Kurobe (Toshiba Corporation) |
[more] |
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| IST, IEICE-ICD |
2011-07-22
10:25 |
Hiroshima |
Hiroshima Institute of Technology |
Analysis Methods of Substrate Sensitivity in an Analog Circiut
Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
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| IST, IEICE-ICD |
2010-07-22
10:20 |
Osaka |
Josho Gakuen Osaka Center |
In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors
Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
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