Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IEICE-ICD, IEICE-SDM, IST [detail] |
2024-08-06 14:35 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Evaluation of Electromagnetic Noise Emitted from Electronic Circuits in Industrial Drones and its Interference on GPS Hiraku Uehara (Kobe Univ.), Koh Watanabe (NICT), Sosuke Ashida, Yushi Mitsuya, Satoshi Tanaka, Makoto Nagata (Kobe Univ.) |
In recent years, autonomous vehicles have been developed, and drones are rapidly becoming more popular.
However, there ... [more] |
|
IEICE-ICD, IEICE-SDM, IST [detail] |
2024-08-06 15:00 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Evaluation and analysis of thermal characteristics near the chip in 3D stacked chips Shuhei Yokota, Rikuu Hasegawa, Kazuki Monta, Takaaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-01 10:45 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
A research on a cryogenic ADC for acquisition of environmental noise near quantum devices. Tomoya Yamada, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-01 11:10 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Evaluation on Flip-Chip Packaging for Quantum Computers at Cryogenic Temperature Misato Taguchi, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08 15:05 |
Online |
On-line |
Evaluation of Backside Voltage Disturbance Impacts and IC Chip Response in Flip Chip Packaging Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08 15:55 |
Online |
On-line |
A cryogenic digital-to-analog converter for high-fidelity control of large-scale qubit arrays Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
IEICE-SDM, IEICE-ICD, IST [detail] |
2021-08-18 15:35 |
Online |
Online |
On-chip multi-channel noise sensor circuits to detect off-chip security attacks Ryozo Takahashi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] |
|
IEICE-ICD, IEICE-SDM, IST [detail] |
2020-08-06 13:50 |
Online |
Online |
Over-the-top Si Interposer Embedding Backside Buried Metal to Reduce Power Supply Impedance Takuji Miki, Makoto Nagata, Akihiro Tsukioka (Kobe Univ.), Noriyuki Miura (Osaka Univ.), Takaaki Okidono (ECSEC), Yuuki Araga, Naoya Watanabe, Haruo Shimamoto, Katsuya Kikuchi (AIST) |
[more] |
|
IEICE-SDM, IEICE-ICD, IST [detail] |
2019-08-09 12:00 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
Evaluation of generation and reduction technology of unnecessary radio waves by digital IC chip Kosuke Jike, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ) |
[more] |
|
IST, IEICE-ICD, IEICE-SDM |
2018-08-08 12:50 |
Hokkaido |
Hokkaido University M Bldg. M151 |
Measurements and Analysis of Power Supply Noise in Digital IC Chip Kosuke Jike, Akihiro Tsukioka, Ryohei Sawada, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ) |
[more] |
|
IST, IEICE-ICD |
2014-07-03 10:25 |
Shimane |
|
Design of 1mm-Pitch 80x80-Channel 322Hz-Frame-Rate Touch Sensor with Two-Step Dual-Mode Capacitance Scan Noriyuki Miura (Kobe Univ.), Shiro Dosho (Pana.), Daisuke Fujimoto, Takuya Kiriyama (Kobe Univ.), Hiroyuki Tezuka, Takuji Miki (Pana.), Makoto Nagata (Kobe Univ.) |
A 1mm-pitch 80x80-channel 322Hz-frame-rate capacitive touch sensor has been developed. Multiple touch points are detecte... [more] |
|
IST, IEICE-ICD |
2013-07-05 17:20 |
Hokkaido |
Sun ref re Hakodate |
Equivalent circuit representation of silicon substrate coupling of active RF components Naoya Azuma, Makoto Nagata (Kobe univ.) |
[more] |
|
IEICE-EMCJ, BCT |
2013-03-08 15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Proposal of a New In-Band Spurious Suppression Technique usable for LTE-Class RFIC
-- Magnetic Thin Film Integration by Back-End-of-Line Process -- Sho Muroga, Yasushi Endo, Tetsuo Ito, Satoshi Tanaka (Tohoku Univ.), Motoki Murakami, Kazuaki Hori (Renesas Electronics), Satoru Takahashi (Renesas Mobile), Naoya Azuma, Makoto Nagata (Kobe Univ.), Masahiro Yamaguchi (Tohoku Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 10:25 |
Hiroshima |
Hiroshima Institute of Technology |
Analysis Methods of Substrate Sensitivity in an Analog Circiut Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 10:50 |
Hiroshima |
Hiroshima Institute of Technology |
A Diagnosis Testbench of Analog IP Cores Against On-Chip Environmental Disturbances Yuuki Araga, Takushi Hashida, Shinichiro Ueyama, Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 11:15 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
Noise Reduction Technology for RFIC receiver of LTE-Class Cell Phone Handset
-- From the View Point of Magnetic Near Field Measurement and Countermeasure -- Masahiro Yamaguchi, Yasushi Endo (Tohoku Univ.), Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 09:30 |
Osaka |
Josho Gakuen Osaka Center |
On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration Takushi Hashida, Hiroshi Matsumoto, Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 09:55 |
Osaka |
Josho Gakuen Osaka Center |
The Minimal Structure of On-Chip Monitoring and Application to Evaluation of Chip Environments Yuuki Araga, Takushi Hashida, Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 10:20 |
Osaka |
Josho Gakuen Osaka Center |
In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
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