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Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST |
2023-03-27 13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
A 2.97μm-pitch Event-based Vision Sensor with Shared Pixel Front-end Circuitry and Low-noise Intensity Readout Mode Futa Mochizuki, Atsumi Niwa (SSS), Raphael Berner (AVS), Takuya Maruyama, Toshio Terano, Kenichi Takamiya, Yasutaka Kimura, Kyoji Mizoguchi, Takahiro Miyazaki, Shun Kaizu, Hirotsugu Takahashi, Atsushi Suzuki (SSS), Christian Braendli (AVS), Hayato Wakabayashi, Yusuke Oike (SSS) |
[more] |
IST2023-7 pp.5-8 |
IST |
2020-03-27 09:50 |
Tokyo |
Kikaishinko kaikan (Postponed) |
A 1280 x 720 Back-Illuminated Stacked Temporal Contrast Event-based Vision Sensor with 4.86μm Pixels, 1.066GEPS Readout, Programmable Event Rate Controller and Compressive Data Formatting Pipeline Thomas Finateu (Prophesee), Atsumi Niwa (Sony), Daniel Matolin (Prophesee), Koya Tsuchimoto (Sony), Andrea Mascheroni, Etienne Reynaud (Prophesee), Pooria Mostafalu, Frederick Brady (Sony), Ludovic Chotard, Florian LeGoff (Prophesee), Hirotsugu Takahashi, Hayato Wakabayashi, Yusuke Oike (Sony), Christoph Posch (Prophesee) |
Event-based vision and image sensors, due to large circuitry in each pixel, benefit from wafer-stacking to achieve compe... [more] |
IST2020-10 pp.13-16 |
IST |
2018-03-09 11:00 |
Tokyo |
NHK Housou-Gijyutu Lab. |
A Back-Illuminated Global-Shutter CMOS Image Sensor with Pixel-Parallel 14b Subthreshold ADC Koji Ogawa, Masaki Sakakibara, Shin Sakai, Yasuhisa Tochigi, Katsumi Honda, Hidekazu Kikuchi, Takuya Wada, Yasunobu Kamikubo, Tsukasa Miura, Masahiko Nakamizo (Sony Semiconductor Solutions), Naoki Jyo, Ryo Hayashibara (Sony Semiconductor Manufacturing), Yohei Furukawa, Shinya Miyata (Sony LSI Design), Satoshi Yamamoto, Yoshiyuki Ota, Hirotsugu Takahashi, Tadayuki Taura, Yusuke Oike, Keiji Tatani, Takayuki Ezaki, Teruo Hirayama (Sony Semiconductor Solutions) |
[more] |
IST2018-14 pp.13-16 |
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