| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2025-09-18
15:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Pixel Design of Gain-Boosted Event-Based Vision Sensor to Control Event Noise and Latency at Low Illuminance
Masahiro Tsukamoto, Yusuke Sato, Futa Mochizuki, Hirotsugu Takahashi, Kazuyoshi Yamashita, Atsumi Niwa, Tetsuji Yamaguchi, Hayato Wakabayashi, Yusuke Oike (Sony Semiconductor Solutions) |
Event-based vision sensor (EVS) generally faces issues with false detection, commonly known as the background rate (BGR)... [more] |
IST2025-43
pp.29-32 |
| IST |
2024-03-27
10:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
216 fps 672 × 512 pixel 3 μm Indirect Time-of-Flight Image Sensor with 1-Frame Depth Acquisition for Motion Artifact Suppression
Chihiro Okada, Sozo Yokogawa, Yuhi Yorikado, Katsumi Honda, Naoki Okuno, Ryohei Ikeno, Makoto Yamakoshi, Hiroshi Ito (SSS), Shohei Yoshitsune, Masatsugu Desaki, Shota Hida (SCK), Atsushi Nose, Hayato Wakabayashi, Fumihiko Koga (SSS) |
[more] |
IST2024-11
pp.1-3 |
| IST |
2023-09-15
13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Tap mismatch mitigation of 3µm 2tap pixels of indirect Time-of-Flight image sensor for high-speed depth mapping
Mizuki Akaike, Yuhi Yorikado, Sozo Yokogawa, Chihiro Okada, Komomo Kodama, Risa Iwashita, Katsumi Honda, Takahiro Hamasaki, Shohei Yoshitsune, Yuki Hanabusa, Kei Nagoya, Masatsugu Desaki, Shota Hida, Hayato Wakabayashi, Koga Fumihiko (Sony) |
[more] |
IST2023-38
pp.13-16 |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-02
10:45 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
The Image Sensor Technology: Building the Foundation for Information Sensing Societies and Fusion of Imaging
Hayato Wakabayashi (Sony Semiconductor Solutions) |
[more] |
IST2023-31
p.13 |
| IST |
2023-03-27
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2.97μm-pitch Event-based Vision Sensor with Shared Pixel Front-end Circuitry and Low-noise Intensity Readout Mode
Futa Mochizuki, Atsumi Niwa (SSS), Raphael Berner (AVS), Takuya Maruyama, Toshio Terano, Kenichi Takamiya, Yasutaka Kimura, Kyoji Mizoguchi, Takahiro Miyazaki, Shun Kaizu, Hirotsugu Takahashi, Atsushi Suzuki (SSS), Christian Braendli (AVS), Hayato Wakabayashi, Yusuke Oike (SSS) |
[more] |
IST2023-7
pp.5-8 |
| IST |
2020-03-27
09:50 |
Tokyo |
Kikaishinko kaikan
(Postponed) |
A 1280 x 720 Back-Illuminated Stacked Temporal Contrast Event-based Vision Sensor with 4.86μm Pixels, 1.066GEPS Readout, Programmable Event Rate Controller and Compressive Data Formatting Pipeline
Thomas Finateu (Prophesee), Atsumi Niwa (Sony), Daniel Matolin (Prophesee), Koya Tsuchimoto (Sony), Andrea Mascheroni, Etienne Reynaud (Prophesee), Pooria Mostafalu, Frederick Brady (Sony), Ludovic Chotard, Florian LeGoff (Prophesee), Hirotsugu Takahashi, Hayato Wakabayashi, Yusuke Oike (Sony), Christoph Posch (Prophesee) |
Event-based vision and image sensors, due to large circuitry in each pixel, benefit from wafer-stacking to achieve compe... [more] |
IST2020-10
pp.13-16 |
| IST |
2018-03-09
11:40 |
Tokyo |
NHK Housou-Gijyutu Lab. |
A 1/4-inch 3.9Mpixel Low Power Event-driven Back-illuminated Stacked CMOS Image sensor
Oichi Kumagai, Atsumi Niwa, Katsuhiko Hanzawa, Hidetaka Kato, Shinichiro Futami, Toshio Ohyama, Tsutomu Imoto, Masahiko Nakamizo (Sony Semiconductor Solutions), Hirotaka Murakami (Sony Electronics), Tatsuki Nishino, Anas Bostamam, Takahiro Iinuma, Naoki Kuzuya (Sony Semiconductor Solutions), Kensuke Hatsukawa (Sony LSI Design), Brady, Frederick, Bidermann, William (Sony Electronics), Toshifumi Wakano (Sony Semiconductor Solutions), Hayato Wakabayashi, Yoshikazu Nitta (Sony Electronics) |
The applications, in battery-limited environments, can profit from an event-driven approach for moving-object detection.... [more] |
IST2018-16
pp.21-24 |
| IST |
2018-03-09
13:50 |
Tokyo |
NHK Housou-Gijyutu Lab. |
An Experimental CMOS Photon Detector with 0.5e- RMS Temporal Noise and 15μm pitch Active Sensor Pixels
Toshiyuki Nishihara, Matsuo Matsumura,, Tsutomu Imoto, Kenichi Okumura, Yorito Sakano, Yuhi Yorikado, Yoshiaki Tashiro, Hayato Wakabayashi, Yusuke Oike, Yoshikazu Nitta (Sony Semiconductor Solutions) |
This is the first reported non-electron-multiplying CMOS Image Sensor (CIS) photon-detector for replacing Photo Multipli... [more] |
IST2018-19
pp.35-38 |
| IST |
2017-09-25
15:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Region Control Oriented Stacked CMOS Image Sensor with Array-Parallel ADC Architecture
Takahito Yamauchi, Tomohiro Takahashi (Sony Semiconductor Solutions), Yuichi Kaji (Sony Electronics Incorporated), Yasunori Tsukuda, Shinichiro Futami (Sony Semiconductor Solutions), Katsuhiko Hanzawa, Ping Wah Wong, Frederick Brady, Phil Holden, Thomas Ayers (Sony Electronics Incorporated), Kyohei Mizuta, Susumu Ohki, Keiji Tatani, Takashi Nagano (Sony Semiconductor Solutions), Hayato Wakabayashi (Sony Electronics Incorporated), Yoshikazu Nitta (ony Semiconductor Solutions) |
A 4.1Mpix 280fps stacked CMOS image sensor with array-parallel ADC architecture is developed for region control applicat... [more] |
IST2017-57
pp.35-38 |
| IST |
2016-09-26
13:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Accelerating the Sensing World through Imaging Evolution
Satoshi Yoshihara, Tetsuo Nomoto, Yusuke Oike, Hayato Wakabayashi (Sony Semiconductor Solutions) |
[more] |
IST2016-42
pp.1-5 |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-01
09:15 |
Osaka |
Central Electric Club |
[Invited Talk]
Accelerating the Sensing World through Imaging Evolution
Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions) |
[more] |
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