ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
|
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
|
| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2019-06-18
14:40 |
Tokyo |
Tokyo University of Sci. Morito Kinenkan (Tokyo) |
Measurement of gas concentration distribution in vacuum chamber using high SN ratio absorption imaging
Keigo Takahashi, Yhang Ricardo Sipauba Carvalho da Silva, Naoki Numao, Rihito Kuroda, Yasuyuki Fujihara, Maasa Murata, Hidekazu Ishii, Tatsuo Morimoto, Tomoyuki Suwa, Akinobu Teramoto, Shigetoshi Sugawa (Tohoku Univ.) |
This paper reports gas concentration absorption imaging in a vacuum chamber using a LOFIC CMOS image sensor with high si... [more] |
IST2019-37
pp.11-14 |
| IST |
2017-09-25
11:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
Statistical analysis of random telegraph noise in pixel source follower
-- Impacts of transistor shape, time constants and number of states --
Rihito Kuroda, Akinobu Teramoto, Shinya Ichino, Takezo Mawaki, Shunichi Wakashima, Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2017-52
pp.13-16 |
| IST |
2015-05-08
15:00 |
Tokyo |
(Tokyo) |
Effect of random telegraph noise reduction by atomically flat gate insulator film/Si interface
Rihito Kuroda, Toshiki Obara, Tetsuya Goto, Naoya Akagawa, Daiki Kimoto, Akinobu Teramoto, Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2015-33
pp.35-38 |
| IST |
2014-03-14
14:00 |
Tokyo |
NHK (Tokyo) |
A Statistical Analysis of Dependencies of Random Telegraph Noise Time Constants on Operation Conditions
Rihito Kuroda, Akihiro Yonezawa, Toshiki Obara, Akinobu Teramoto, Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2014-12
pp.15-18 |
| IST |
2010-09-27
16:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics
Kenichi Abe, Akinobu Teramoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) |
Physical analysis and reduction of random telegraph noise (RTN), which has become a major problem on advanced CMOS image... [more] |
IST2010-47
pp.29-32 |
|
|
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|