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IST
,
IEICE-ICD
,
IEICE-SDM
2018-08-07
11:30
Hokkaido
Hokkaido University M Bldg. M151
Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process
Kodai Yamada
,
Jun Furuta
,
Kazutoshi Kobayashi
(
KIT
)
[more]
IEICE-MRIS
,
MMS
2016-06-09
15:45
Miyagi
Tohoku Univ.
[Invited Talk] Current driven domain wall motion of RE-TM alloy/Pt magnetic wires
Hiroyuki Awano
,
Satoshi Sumi
,
Yuichiro Kurokawa
,
Do Bang
(
TTI
)
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