| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-02
09:00 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
A 33kDMIPS 6.4W Vehicle Communication Gateway Processor Achieving 10Gbps/W Network Routing, 40ms CAN Bus Start-Up and 1.4mW Standby Power
Kenichi Shimada, Keiichiro Sano, Kazuki Fukuoka, Hiroshi Morita, Masayuki Daito, Tatsuya Kamei, Hiroyuki Hamasaki, Yasuhisa Shimazaki (Renesas) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-10
15:00 |
Online |
On-line |
[Invited Talk]
A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems
Fukashi Morishita, Norihito Kato, Satoshi Okubo, Takao Toi, Mitsuru Hiraki, Sugako Otani, Hideaki Abe, Yuji Shinohara, Hiroyuki Kondo (Renesas Electronics) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2021-08-18
13:00 |
Online |
Online |
[Invited Talk]
A 12nm autonomous driving processor running 60.4 TOPS and 13.8 TOPS/W CNNs with task-separated ASIL D control
Katsushige Matsubara, Lieske Hanno (Renesas Electronics), Motoki Kimura (Renesas Electronics Europe), Atsushi Nakamura, Manabu Koike, Kazuaki Terashima, Shun Morikawa, Yoshihiko Hotta, Takahiro Irita, Seiji Mochizuki, Hiroyuki Hamasaki, Tatsuya Kamei (Renesas Electronics) |
[more] |
|
| IST |
2019-09-20
14:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel with pyramid textured interfaces for diffraction
Tatsuya Kunikiyo, Yotaro Goto, Fumitoshi Takahashi, Hidenori Sato, Takeshi Kamino, Koji Iizuka, Kenichiro Sonoda, Tomohiro Yamashita (Renesas) |
[more] |
IST2019-49
pp.25-28 |
| IEICE-SDM, IEICE-ICD, IST [detail] |
2019-08-07
16:30 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
[Invited Talk]
High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2019-08-09
10:50 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
[Invited Talk]
A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture supporting ISO26262 ASIL-D
Naoto Okumura, Sugako Otani, Norimasa Otsuki, Yasufumi Suzuki, Shohei Maeda, Tomonori Yanagita, Takao Koike, Masao Ito, Minoru Uemura, Yasuhisa Shimazaki, Toshihiro Hattori, Noriaki Sakamoto, Hiroyuki Kondo (Renesas Electronics Corp.) |
[more] |
|
| IST, IEICE-ICD, IEICE-SDM |
2018-08-08
13:15 |
Hokkaido |
Hokkaido University M Bldg. M151 |
Highly Symmetrical 10T 2-Read/Write Dual-port SRAM Bitcell Design In 28nm High-k/Metal-gate Planar Bulk CMOS Technology
Yuichiro Ishii, Miki Tanaka, Makoto Yabuuchi, Yohei Sawada, Shinji Tanaka, Koji Nii (Renesas), Tien Yu Lu, Chun Hsien Huang, Shou Sian Chen, Yu Tse Kuo, Ching Cheng Lung, Osbert Cheng (UMC) |
[more] |
|
| IST, IEICE-ICD, IEICE-SDM |
2018-08-09
12:45 |
Hokkaido |
Hokkaido University M Bldg. M151 |
Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) |
[more] |
|
| IST, IEICE-ICD, IEICE-SDM |
2018-08-09
13:10 |
Hokkaido |
Hokkaido University M Bldg. M151 |
12-nm Fin-FET 3.0G-search/s 80-bit x 128-entry Dual-port Ternary CAM
Makoto Yabuuchi, Masao Morimoto, Koji Nii, Shinji Tanaka (Renesas) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2017-07-31
10:40 |
Hokkaido |
Hokkaido-Univ. Multimedia Education Bldg. |
A 65 nm 1.0V 1.84ns Silicon-on-Thin-Box (SOTB) Embedded SRAM with 13.72 nW/Mbit Standby Power for Smart IoT
Makoto Yabuuchi, Koji Nii (Renesas), Shinozaki Yoshihiro (NSW), Yoshiki Yamamoto, Takumi Hasegawa, Hiroki Shinkawata, Shiro Kamohara (Renesas) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2017-08-01
13:00 |
Hokkaido |
Hokkaido-Univ. Multimedia Education Bldg. |
[Invited Lecture]
A 3.2ppm/ºC Second-Order Temperature Compensated CMOS On-Chip Oscillator Using Voltage Ratio Adjusting Technique
Guoqiang Zhang, Kosuke Yayama, Akio Katsushima (Renesas System Design), Takahiro Miki (Renesas Electronics) |
[more] |
|
| IST |
2016-09-26
16:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
White Spots Reduction by Ultimate Proximity Metal Gettering at Carbon Complexes Formed underneath Contact Area in CMOS Image Sensors
Tadashi Yamaguchi, Tomohiro Yamashita (Renesas), Takeshi Kamino, Yotaro Goto, Takashi Kuroi (RSMC), Masazumi Matsuura (Renesas) |
[more] |
IST2016-47
pp.23-26 |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-03
13:20 |
Osaka |
Central Electric Club |
[Invited Talk]
A 16nm FinFET Heterogeneous Nona-Core SoC Supporting Functional Safety Standard ISO26262 ASIL B
Chikafumi Takahashi, Shinichi Shibahara, Kazuki Fukuoka, Jun Matsushima, Yuko Kitaji (Renesas System Design), Yasuhisa Shimazaki, Hirotaka Hara, Takahiro Irita (Renesas Electronics) |
[more] |
|
| IST |
2015-09-18
15:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Investigation of Implantation Damage Recovery using Microwave Annealing for High Performance Image Sensing Devices.
Masatoshi Kimura (RSMC), Tadashi Yamaguchi (Renesas Electronics), Takashi Kuroi (RSMC) |
[more] |
IST2015-54
pp.45-48 |
|