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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2017-03-10
15:15 |
Tokyo |
NHK Research Lab. Auditorium (Setagaya) |
A Low Read Noise High Conversion Gain CMOS Image Sensors using Reset-Gate-Less Pixel
Min-Woong Seo, Tong xi Wang (Shizuoka Univ.), Sung-Wook Jun, Tomoyuki Akahori (Brookman Tech.), Shoji Kawahito (Shizuoka Univ.) |
[more] |
IST2017-17
pp.35-38 |
| IST |
2016-03-11
10:10 |
Tokyo |
NHK Research Lab (Setagaya) |
A CMOS Image Sensor Using Multiple Tap Lateral-Electric-Field Charge Modulators for Time-of-Flight Range Imaging
Taichi Kasugai, Sang-Man Han, Hanh Trang, Taishi Takasawa (Shizuoka Univ.), Satoshi Aoyama (Brookman Tech.), Keita Yasutomi, Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ.) |
This paper presents a 160×240-pixel CMOS Time-of-Flight range imager using pinned-photodiode high-speed 4-tap outputs lo... [more] |
IST2016-9
pp.9-12 |
| IST |
2014-12-01
16:30 |
Tokyo |
Tamachi Campus, Tokyo Institute of Technology |
[Poster Presentation]
A Time-of-Flight CMOS Image Sensor with 4-Tap Lateral-Electric-Field Charge Modulators
Taichi Kasugai, Sang-Man Han, Hanh Trang, Taishi Takasawa (Shizuoka Univ.), Satoshi Aoyama (Brookman Tech.), Keita Yasutomi, Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ.) |
This paper presents a CMOS ToF range imager with 4-tap charge modulator using pinned-photodiode high-speed lock-in pixel... [more] |
IST2014-72
pp.39-40 |
| IST |
2014-03-14
16:10 |
Tokyo |
NHK |
A 413×240-Pixel Sub-Centimeter Resolution Time-of-Flight CMOS Image Sensor with In-Pixel Background Canceling Using Lateral-Electric-Field Charge Modulators
Sang-Man Han, Taishi Takasawa (Shizuoka Univ.), Tomoyuki Akahori (Brookman Tech.), Keita Yasutomi, Keiichiro Kagawa, Shoji Kawahito (Shizuoka Univ.) |
[more] |
IST2014-15
pp.27-30 |
| IST, CE |
2011-05-13
13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An 80μVrms Temporal Noise 82dB Dynamic Range CMOS Image Sensor with a 13 to 19b Variable Resolution Column-Parallel Folding Integration/Cyclic ADC
Min-Woong Seo, Sungho Suh (Shizuoka Univ.), Tetsuya Iida (Brookman Tech.), Hiroshi Watanabe (Sanei Hytechs), Taishi Takasawa (Shizuoka Univ.), Tomoyuki Akahori, Keigo Isobe, Takashi Watanabe (Brookman Tech.), Shinya Itoh, Shoji Kawahito (Shizuoka Univ.) |
A 1Mpixel CMOS image sensor with column-parallel folding-integration and cyclic ADCs has 80μVrms (1.2e-) temporal noise,... [more] |
IST2011-10 CE2011-16
pp.1-4 |
| IST |
2009-09-28
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Effects of Negative Bias Operation and Optical Stress on Dark Current
Takashi Watanabe, Jong-Ho Park, Satoshi Aoyama, Keigo Isobe (Brookman Tech.), Shoji Kawahito (Shizuoka Univ.) |
[more] |
IST2009-47
pp.5-8 |
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