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Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST |
2024-09-25 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo, Online) (Primary: On-site, Secondary: Online) |
[Tutorial Lecture]
State-of-the-Art High Dynamic Range Technologies for CMOS Image Sensors Ken Miyauchi (Brillnics/Tohoku Univ.) |
In this paper, state-of-the-art high dynamic range technologies for CMOS image sensors, which have been reported in majo... [more] |
IST2024-43 pp.1-4 |
IST |
2020-03-27 17:20 |
Tokyo |
Kikaishinko kaikan (Tokyo) (Postponed) |
A Single Exposure Linear Response Over 120dB Dynamic Range CMOS Image Sensor with Two-stage Lateral Overflow Integration Trench Capacitors Yasuyuki Fujihara, Maasa Murata, Shota Nakayama, Rihito Kuroda, Shigetoshi Sugawa (Tohoku Unib.) |
This paper presents a prototype linear response single exposure CMOS image sensor with two-stage lateral overflow integr... [more] |
IST2020-25 pp.81-84 |
IST |
2019-09-20 13:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
Optical Performance of A 120 ke- Full Well Capacity and 160µV/e- Conversion Gain 2.8µm Back Side Illuminated Pixel with Lateral Overflow Integration Capacitor Ken Miyauchi, Kazuya Mori, Isao Takayanagi, Junichi Nakamura (BRILLNICS), Shigetoshi Sugawa (Tohoku Univ.) |
In this paper, we report about a prototype CMOS image sensor with a 2.8µm back side illuminated (BSI) pixel that employs... [more] |
IST2019-48 pp.21-24 |
IST |
2015-09-18 16:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
Analysis and Reduction of Floating Diffusion Capacitance Components and Application to High Sensitivity and High Full Well Capacity CMOS Image Sensor Fumiaki Kusuhara, Shunichi Wakashima, Satoshi Nasuno, Rihito Kuroda, Shigetoshi Sugawa (Tohoku Univ.) |
This paper reports the analysis and reduction technology of components of floating diffusion (FD) capacitance (CFD) and ... [more] |
IST2015-56 pp.53-56 |
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