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Committee Date Time Place Paper Title / Authors Abstract Paper #
IEICE-SDM, IEICE-ICD, IST [detail] 2021-08-17
13:55
Online Online Study of an Event-Driven CMOS Image Sensor Using Deep Learning (1) -- Verification of Image Classification Using Low Bit-Resolution Feature Images --
Kohei Yamamoto, Kota Yoshida, Shunsuke Okura (Ritsumeikan Univ.)
Currently, CMOS image sensors are expected to be integrated with AI using deep learning to create new technologies.
C... [more]
IST2021-43
pp.29-33
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