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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-BioX, IEICE-SIP, IEICE-IE, IST, ME [detail] |
2023-05-19
14:00 |
Mie |
Sansui Hall, Mie University
(Primary: On-site, Secondary: Online) |
Frequency Bandwidth Reduction of High-Frequency Intra-Body Propagation Characteristics Used for Attacker's Touch Detection in Fingerprint Authentication
Shunichi Tomura, Koki Yamada, Takahiro Yoshida (TUS) |
[more] |
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| IEICE-SDM, IEICE-ICD, IST [detail] |
2017-08-02
11:35 |
Hokkaido |
Hokkaido-Univ. Multimedia Education Bldg. |
Gate Controlled Diode Characteristics of Super Steep Subthreshold Slope PN-Body Tied SOI-FET for High Efficiency RF Energy Harvesting
Shun Momose, Jiro Ida, Takayuki Mori, Takahiro Yoshida, Junpei Iwata, Takashi Horii, Takahiro Furuta, Takuya Yamada, Daichi Takamatsu, Kenji Itoh (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK) |
[more] |
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| IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-03
14:40 |
Osaka |
Central Electric Club |
PN-Body Tied Super Steep SS FET with Body Bias below 1V and Drain Bias 0.1V
Takahiro Yoshida, Jiro Ida, Takashi Horii (KIT), Masao Okihara (Lapis), Yasuo Arai (KEK) |
We have found out that the super steep Subthreshold Slope (SS) of the PN-body tied SOI FET appeared with the body voltag... [more] |
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| IEICE-BioX, ME, IST [detail] |
2015-06-29
13:30 |
Tokyo |
Kanazawa University, Kakuma Campus |
A Study on Easy Owner Authentication using Hand-written Alphabets on Smart Phone
Shingo Watanabe, Takahiro Yoshida, Seiichiro Hangai (TUS) |
[more] |
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| ME, IEICE-BS |
2010-12-16
11:30 |
Tokyo |
Tokyo Metropolitan Univ. |
A Proposal of Screening Method using signature period and pen altitude in Signature Verification
Kyohei Koyama, Takahiro Yoshida, Noya Wada, Seiichiro Hangai (Tokyo Univ of science) |
In online signature verification, an improvement of robustness to imitating forgeries and tracing forgeries is subject t... [more] |
ME2010-166
pp.9-12 |
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