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IST, IEICE-ICD 2013-07-05
16:55		 Hokkaido Sun ref re Hakodate A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET
Hideo Sakai (Keio Univ.), Shin-ichi O'uchi, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Yuki Ishikawa, Junichi Tsukada, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.) 		 [more]
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