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Paper Abstract and Keywords
Presentation 2023-08-03 15:05
Gate Driver IC with Fully Integrated Overcurrent Protection by Measuring Gate-to-Emitter Voltage
Haifeng Zhang, Dibo Zhang, Hiromu Yamasaki, Katsuhiro Hata (Univ. of Tokyo), Keiji Wada (Tokyo Metropolitan Univ.), Kan Akatsu (Yokohama National Univ.), Ichiro Omura (Kyusyu Institute of Technology), Makoto Takamiya (Univ. of Tokyo)
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Reference Info. ITE Tech. Rep.
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Date of Issue  
ISSN Online edition: ISSN 2424-1970
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Conference Information
Committee IEICE-ICD IEICE-SDM IST  
Conference Date 2023-08-01 - 2023-08-03 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To IEICE-ICD 
Conference Code 2023-08-SDM-ICD-IST 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Gate Driver IC with Fully Integrated Overcurrent Protection by Measuring Gate-to-Emitter Voltage 
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1st Author's Name Haifeng Zhang  
1st Author's Affiliation The University of Tokyo (Univ. of Tokyo)
2nd Author's Name Dibo Zhang  
2nd Author's Affiliation The University of Tokyo (Univ. of Tokyo)
3rd Author's Name Hiromu Yamasaki  
3rd Author's Affiliation The University of Tokyo (Univ. of Tokyo)
4th Author's Name Katsuhiro Hata  
4th Author's Affiliation The University of Tokyo (Univ. of Tokyo)
5th Author's Name Keiji Wada  
5th Author's Affiliation Tokyo Metropolitan University (Tokyo Metropolitan Univ.)
6th Author's Name Kan Akatsu  
6th Author's Affiliation Yokohama National University (Yokohama National Univ.)
7th Author's Name Ichiro Omura  
7th Author's Affiliation Kyusyu Institute of Technology (Kyusyu Institute of Technology)
8th Author's Name Makoto Takamiya  
8th Author's Affiliation The University of Tokyo (Univ. of Tokyo)
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Date Time 2023-08-03 15:05:00 
Presentation Time 25 minutes 
Registration for IEICE-ICD 
Paper #  
Volume (vol) vol.47 
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