| Paper Abstract and Keywords |
| Presentation |
2019-01-25 09:55
[Poster Presentation]
Current injection type emission devices using CuAlS2:Mn phosphor thin films
-- SiO2 barrier layer suppressing interfacial diffusion between phosphor/electrode layers --
Shogo Ueda, Kazuki Tujimori, Tadashi Ishigaki, Koutoku Ohmi (Tottori Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
Red light-emitting devices consisting of CuAlS2:Mn polycrystalline phosphor thin films have been investigated. CuAlS2:Mn thin films were prepared by conventional electron-beam evaporation method at 600℃ using a self-preparing CuAlS2:Mn pellet. It has been confirmed that the SiO2 barrier layer is necessary to suppress a interfacial diffusion between the CuAlS2:Mn and ZnO layers during the deposition of the CuAlS2:Mn layer. From the SEM observation, a relatively smooth interface is observed. It is also found that the PL intensity is remarkably increased by inserting the SiO2 layer. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
CuAlS2:Mn / phosphor thin film / current injection type emission device / SiO2 barrier layer / / / / |
| Reference Info. |
ITE Tech. Rep., vol. 43, no. 1, IDY2019-17, pp. 81-84, Jan. 2019. |
| Paper # |
IDY2019-17 |
| Date of Issue |
2019-01-17 (IDY) |
| ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
| Download PDF |
|
| Conference Information |
| Committee |
IDY IEICE-EID IEIJ-SSL SID-JC IEE-EDD |
| Conference Date |
2019-01-24 - 2019-01-25 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
|
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
|
| Paper Information |
| Registration To |
IDY |
| Conference Code |
2019-01-IDY-EID-SSL-JC-EDD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Current injection type emission devices using CuAlS2:Mn phosphor thin films |
| Sub Title (in English) |
SiO2 barrier layer suppressing interfacial diffusion between phosphor/electrode layers |
| Keyword(1) |
CuAlS2:Mn |
| Keyword(2) |
phosphor thin film |
| Keyword(3) |
current injection type emission device |
| Keyword(4) |
SiO2 barrier layer |
| Keyword(5) |
|
| Keyword(6) |
|
| Keyword(7) |
|
| Keyword(8) |
|
| 1st Author's Name |
Shogo Ueda |
| 1st Author's Affiliation |
Tottori University (Tottori Univ.) |
| 2nd Author's Name |
Kazuki Tujimori |
| 2nd Author's Affiliation |
Tottori University (Tottori Univ.) |
| 3rd Author's Name |
Tadashi Ishigaki |
| 3rd Author's Affiliation |
Tottori University (Tottori Univ.) |
| 4th Author's Name |
Koutoku Ohmi |
| 4th Author's Affiliation |
Tottori University (Tottori Univ.) |
| 5th Author's Name |
|
| 5th Author's Affiliation |
() |
| 6th Author's Name |
|
| 6th Author's Affiliation |
() |
| 7th Author's Name |
|
| 7th Author's Affiliation |
() |
| 8th Author's Name |
|
| 8th Author's Affiliation |
() |
| 9th Author's Name |
|
| 9th Author's Affiliation |
() |
| 10th Author's Name |
|
| 10th Author's Affiliation |
() |
| 11th Author's Name |
|
| 11th Author's Affiliation |
() |
| 12th Author's Name |
|
| 12th Author's Affiliation |
() |
| 13th Author's Name |
|
| 13th Author's Affiliation |
() |
| 14th Author's Name |
|
| 14th Author's Affiliation |
() |
| 15th Author's Name |
|
| 15th Author's Affiliation |
() |
| 16th Author's Name |
|
| 16th Author's Affiliation |
() |
| 17th Author's Name |
|
| 17th Author's Affiliation |
() |
| 18th Author's Name |
|
| 18th Author's Affiliation |
() |
| 19th Author's Name |
|
| 19th Author's Affiliation |
() |
| 20th Author's Name |
|
| 20th Author's Affiliation |
() |
| Speaker |
Author-1 |
| Date Time |
2019-01-25 09:55:00 |
| Presentation Time |
5 minutes |
| Registration for |
IDY |
| Paper # |
IDY2019-17 |
| Volume (vol) |
vol.43 |
| Number (no) |
no.1 |
| Page |
pp.81-84 |
| #Pages |
4 |
| Date of Issue |
2019-01-17 (IDY) |