| Paper Abstract and Keywords |
| Presentation |
2017-09-25 09:25
Development of Event-Driven Correlated Double Sampling for A/D Converters in Pixel-Parallel 3-D Integrated CMOS Image Sensors
Masahide Goto, Yuki Honda, Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, Yoshinori Iguchi (NHK), Takuya Saraya, Masaharu Kobayashi, Eiji Higurashi, Hiroshi Toshiyoshi, Toshiro Hiramoto (Univ. of Tokyo) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
We report novel event-driven noise reduction circuits with correlated double sampling (CDS) technique for pulse-frequency-modulation (PFM) analog-to-digital converters (ADCs). PFM-ADCs are promising for pixel-parallel 3-D integrated image sensors with excellent imaging performance. The developed ADC with CDS consists of comparators, capacitors, and timing control logic circuits that are designed to generate the triggered clocks to cancel kTC noise in a pixel. We confirmed that the prototype ADC showed noise reduction effects and also an excellent linearity with a wide dynamic range of 120 dB, which indicates the feasibility of high-quality pixel-wise image sensors. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Image sensor / A/D converter / Correlated double sampling / Pixel / 3-D Integration / / / |
| Reference Info. |
ITE Tech. Rep., vol. 41, no. 32, IST2017-49, pp. 1-4, Sept. 2017. |
| Paper # |
IST2017-49 |
| Date of Issue |
2017-09-18 (IST) |
| ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
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