| Paper Abstract and Keywords |
| Presentation |
2015-09-18 16:40
Analysis and Reduction of Floating Diffusion Capacitance Components and Application to High Sensitivity and High Full Well Capacity CMOS Image Sensor
Fumiaki Kusuhara, Shunichi Wakashima, Satoshi Nasuno, Rihito Kuroda, Shigetoshi Sugawa (Tohoku Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
This paper reports the analysis and reduction technology of components of floating diffusion (FD) capacitance (CFD) and its application to a high sensitivity and high full well capacity CMOS image sensor. We analyzed the result of CFD components extracted by the developed test patterns, and proposed FD structure with non-LDD and low concentration diffusion layer to reduce CFD. CMOS image sensor which has 360H×1680V pixels fabricated by 0.18um CMOS process technology with lateral overflow integration capacitor (LOFIC), dual gain column amplifier, floating capacitor load readout operation, buried channel pixel source follower (SF) transistor and low CFD device structure was evaluated and it exhibited 243uV/e- of conversion gain (CG), 0.46e-rms of readout noise, and 76ke- of full well capacity (FWC). |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Floating Diffusion Capacitance / Lateral Overflow Integration Capacitor / High Sensitivity / High Full Well Capacity / / / / |
| Reference Info. |
ITE Tech. Rep., vol. 39, no. 35, IST2015-56, pp. 53-56, Sept. 2015. |
| Paper # |
IST2015-56 |
| Date of Issue |
2015-09-11 (IST) |
| ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
| Download PDF |
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| Conference Information |
| Committee |
IST |
| Conference Date |
2015-09-18 - 2015-09-18 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
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| Paper Information |
| Registration To |
IST |
| Conference Code |
2015-09-IST |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Analysis and Reduction of Floating Diffusion Capacitance Components and Application to High Sensitivity and High Full Well Capacity CMOS Image Sensor |
| Sub Title (in English) |
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| Keyword(1) |
Floating Diffusion Capacitance |
| Keyword(2) |
Lateral Overflow Integration Capacitor |
| Keyword(3) |
High Sensitivity |
| Keyword(4) |
High Full Well Capacity |
| Keyword(5) |
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| Keyword(6) |
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| 1st Author's Name |
Fumiaki Kusuhara |
| 1st Author's Affiliation |
Tohoku University (Tohoku Univ.) |
| 2nd Author's Name |
Shunichi Wakashima |
| 2nd Author's Affiliation |
Tohoku University (Tohoku Univ.) |
| 3rd Author's Name |
Satoshi Nasuno |
| 3rd Author's Affiliation |
Tohoku University (Tohoku Univ.) |
| 4th Author's Name |
Rihito Kuroda |
| 4th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
| 5th Author's Name |
Shigetoshi Sugawa |
| 5th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2015-09-18 16:40:00 |
| Presentation Time |
30 minutes |
| Registration for |
IST |
| Paper # |
IST2015-56 |
| Volume (vol) |
vol.39 |
| Number (no) |
no.35 |
| Page |
pp.53-56 |
| #Pages |
4 |
| Date of Issue |
2015-09-11 (IST) |