| Paper Abstract and Keywords |
| Presentation |
2013-03-15 13:05
[Invited Talk]
A Fast Non-Contact Inspection Method through Phased Array Systems for High Resolution Flat Panel Pattern
Hiroshi Hamori (OHT), Hideki Katagiri (Hiroshima Univ.), Kosuke Kato (HIT) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
The quality of images on flat panels has been improving remarkably in recent years and as a result ultra high definition TVs such as 4K and 8K have become a reality today. However, manufacturers are yet to resolve many problems when a stable product line with a high throughput is considered. As a way of improving production yield, though there is a repair system that can detect electrical defects on normal flat panels in early stages of manufacturing process and repair them, there is still no method to detect defects on ultra high resolution panels. If those defects are not detected on early stages and only detected in the final stage then the panel will become useless. In this paper we propose a non-contact inspection technique based on phased array principle, that detects open circuits and close circuits on wirings of ultra high resolution flat panels and the experimental results reveal that the this method is useful and efficient for detecting electrical defects. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Electrical Inspection / High Resolution Pattern / Phased array / Non-Contact / / / / |
| Reference Info. |
ITE Tech. Rep., vol. 37, no. 16, IDY2013-16, pp. 1-6, March 2013. |
| Paper # |
IDY2013-16 |
| Date of Issue |
2013-03-08 (IDY) |
| ISSN |
Print edition: ISSN 1342-6893 |
| Download PDF |
|
| Conference Information |
| Committee |
IDY |
| Conference Date |
2013-03-15 - 2013-03-15 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
|
| Paper Information |
| Registration To |
IDY |
| Conference Code |
2013-03-IDY |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
A Fast Non-Contact Inspection Method through Phased Array Systems for High Resolution Flat Panel Pattern |
| Sub Title (in English) |
|
| Keyword(1) |
Electrical Inspection |
| Keyword(2) |
High Resolution Pattern |
| Keyword(3) |
Phased array |
| Keyword(4) |
Non-Contact |
| Keyword(5) |
|
| Keyword(6) |
|
| Keyword(7) |
|
| Keyword(8) |
|
| 1st Author's Name |
Hiroshi Hamori |
| 1st Author's Affiliation |
OHT (OHT) |
| 2nd Author's Name |
Hideki Katagiri |
| 2nd Author's Affiliation |
Hiroshima University (Hiroshima Univ.) |
| 3rd Author's Name |
Kosuke Kato |
| 3rd Author's Affiliation |
Hiroshima Institute of Technology (HIT) |
| 4th Author's Name |
|
| 4th Author's Affiliation |
() |
| 5th Author's Name |
|
| 5th Author's Affiliation |
() |
| 6th Author's Name |
|
| 6th Author's Affiliation |
() |
| 7th Author's Name |
|
| 7th Author's Affiliation |
() |
| 8th Author's Name |
|
| 8th Author's Affiliation |
() |
| 9th Author's Name |
|
| 9th Author's Affiliation |
() |
| 10th Author's Name |
|
| 10th Author's Affiliation |
() |
| 11th Author's Name |
|
| 11th Author's Affiliation |
() |
| 12th Author's Name |
|
| 12th Author's Affiliation |
() |
| 13th Author's Name |
|
| 13th Author's Affiliation |
() |
| 14th Author's Name |
|
| 14th Author's Affiliation |
() |
| 15th Author's Name |
|
| 15th Author's Affiliation |
() |
| 16th Author's Name |
|
| 16th Author's Affiliation |
() |
| 17th Author's Name |
|
| 17th Author's Affiliation |
() |
| 18th Author's Name |
|
| 18th Author's Affiliation |
() |
| 19th Author's Name |
|
| 19th Author's Affiliation |
() |
| 20th Author's Name |
|
| 20th Author's Affiliation |
() |
| 21st Author's Name |
|
| 21st Author's Affiliation |
() |
| 22nd Author's Name |
|
| 22nd Author's Affiliation |
() |
| 23rd Author's Name |
|
| 23rd Author's Affiliation |
() |
| 24th Author's Name |
|
| 24th Author's Affiliation |
() |
| 25th Author's Name |
|
| 25th Author's Affiliation |
() |
| 26th Author's Name |
/ / |
| 26th Author's Affiliation |
()
() |
| 27th Author's Name |
/ / |
| 27th Author's Affiliation |
()
() |
| 28th Author's Name |
/ / |
| 28th Author's Affiliation |
()
() |
| 29th Author's Name |
/ / |
| 29th Author's Affiliation |
()
() |
| 30th Author's Name |
/ / |
| 30th Author's Affiliation |
()
() |
| 31st Author's Name |
/ / |
| 31st Author's Affiliation |
()
() |
| 32nd Author's Name |
/ / |
| 32nd Author's Affiliation |
()
() |
| 33rd Author's Name |
/ / |
| 33rd Author's Affiliation |
()
() |
| 34th Author's Name |
/ / |
| 34th Author's Affiliation |
()
() |
| 35th Author's Name |
/ / |
| 35th Author's Affiliation |
()
() |
| 36th Author's Name |
/ / |
| 36th Author's Affiliation |
()
() |
| Speaker |
Author-1 |
| Date Time |
2013-03-15 13:05:00 |
| Presentation Time |
35 minutes |
| Registration for |
IDY |
| Paper # |
IDY2013-16 |
| Volume (vol) |
vol.37 |
| Number (no) |
no.16 |
| Page |
pp.1-6 |
| #Pages |
6 |
| Date of Issue |
2013-03-08 (IDY) |