| Paper Abstract and Keywords |
| Presentation |
2011-07-21 14:00
[Invited Talk]
An All-Digital Time A/D Converter TAD for Digital Sensors
-- High-Temperature Operation and Multi-Function Application --
Takamoto Watanabe (DENSO) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
In recent years, sensor technology has become one of the most important and critical items for many sophisticated systems such as various mobile devices, audio/visual equipments, medical and biological devices, and especially booming robot systems. Even today’s sensors are still analog types. In these domains sensors must deliver higher performance, be more compact, less expensive, and low-power consumption for sensor networks. Accordingly, the most effective solution must be sensor digitalization for any and all sensors as a whole. We have earlier reported an all-digital A/D converter TAD (Time A/D converter) as a scalable ADC [1]. More and more such demands will grow with expanding applications under severe conditions. Therefore, sensor digitalization will be more important for achieving higher reliability and durability. This paper describes the following: The TAD-type TDC (Time-to-Digital Converter) basic structure, evaluation results (−35–140 °C), and sensor prototype examples (−40–150 °C). Finally, a resolution-improvement method based on time-mode operation and OFDM-application example using multi-functionality are introduced. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
Sensor / Interface / ADC / TDC / TAD / CMOS / Digital / High-temperature |
| Reference Info. |
ITE Tech. Rep., vol. 35, no. 28, IST2011-47, pp. 43-48, July 2011. |
| Paper # |
IST2011-47 |
| Date of Issue |
2011-07-14 (IST) |
| ISSN |
Print edition: ISSN 1342-6893 |
| Download PDF |
|
| Conference Information |
| Committee |
IST IEICE-ICD |
| Conference Date |
2011-07-21 - 2011-07-22 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Hiroshima Institute of Technology |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Analog, Mixed analog and digital, RF, and sensor interface circuitry |
| Paper Information |
| Registration To |
IST |
| Conference Code |
2011-07-IST-ICD |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
An All-Digital Time A/D Converter TAD for Digital Sensors |
| Sub Title (in English) |
High-Temperature Operation and Multi-Function Application |
| Keyword(1) |
Sensor |
| Keyword(2) |
Interface |
| Keyword(3) |
ADC |
| Keyword(4) |
TDC |
| Keyword(5) |
TAD |
| Keyword(6) |
CMOS |
| Keyword(7) |
Digital |
| Keyword(8) |
High-temperature |
| 1st Author's Name |
Takamoto Watanabe |
| 1st Author's Affiliation |
DENSO CORPORATION (DENSO) |
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| Speaker |
Author-1 |
| Date Time |
2011-07-21 14:00:00 |
| Presentation Time |
50 minutes |
| Registration for |
IST |
| Paper # |
IST2011-47 |
| Volume (vol) |
vol.35 |
| Number (no) |
no.28 |
| Page |
pp.43-48 |
| #Pages |
6 |
| Date of Issue |
2011-07-14 (IST) |